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Removed from a Advantest T2000 SoC Test System This Densei-Lambda CKA-3750/S Power Supply is used working surplus
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL BP101979-00 OLAL CONT PB PCB Card is used working surplus
This Balzers BG 541 087-S/B is used working surplus
Inventory # CONJ-1163
Inventory # 17571
Nikon Precision M Plan 40 0.5 ELWD Microscope Objective 210/0 Working Surplus Removed from a Advantest T2000Nikon Precision M Plan 40 0. 5 ELWD Microscope Objective 210 0 Working Surplus Part No: M Plan 40 0. 5 ELWD 210 0 Made in Japan This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 10"x10"x10" @ 5 lbs. Shipping Terms: All Domestic and International shipping quotes and or fees are subject to
US$ 59.95
US$ 26.65
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